Centre for Microsystems Engineering

Scanning Electron Microscope (JOEL JSM-5900LV environmental)

Scanning electron microscope is a standard characterisation technique used to image surface structure and for composition analysis. Electron microscopes have a high resolution allowing the technique to be used in characterisation and imaging of micro and nano device.

Specifications:
- operable under both, high (HV) and low vacuum (LV), (which allows examination of both, electrically conductive and non-conductive materials, with no need for special sample preparation of the latter), and with resolution down to 3nm
- large specimen chamber (allowing examination of samples up to 20cm in diameter)
- Accelerating Voltage 0.3-30kV
- Probe current varying between 10^-12 and 10^-6 A
- Imaging modes: Three kinds of backscattered electron imaging (Composition image, Topographic image and Shadow image)

Availability:
The SEM is available for academic users and corporate/private users outside Lancaster University. Different cost models are applied for academic and industrial users. Trained staff is available to assist you with sample imaging and characterisation. Please contact Andrew Richardson to discuss the terms and fees the use of this equipment.

Contact:
Please contact Andrew Richardson to enquire about the use of this facility as well as requesting a quote for any work with samples and imaging/analysis there of.

Atomic Force Microscope (Veeco CP-II)

Atomic Force Microscope (AFM) is a surface probe where a sharp tip is scanned over the surface of a sample to give a topography (3D surface image) of the sample down to atomic resolution. Magnetic Force microscopy is an extension of the AFM that uses a magnetic tip for detection of stray magnetic fields from the magnetic sample. This technique is routinely used characterisation of magnetic surfaces and structures.

Specifications:
- Sample size: up to 50 mm diameter and 22 mm thick
- XY Control Resolution: 0.1 nm (in Hi mode); 0.02 nm (in low mode)
- Modes of imaging: Contact Mode, Tapping Mode , Magnetic Force Microscopy (MFM).

For more specifications please follow to Veeco website

Availability:
The AFM is available for academic users and corporate/private users outside Lancaster University. Different cost models are applied for academic and industrial users. Trained staff is available to assist you with sample imaging and characterisation. Please contact Andrew Richardson to discuss the terms and fees the use of this equipment.

Contact:
Please contact Andrew Richardson to enquire about the use of this facility as well as requesting a quote for any work with samples and imaging/analysis there of.

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